|
标准号 |
版本 |
发布
时间 |
英文题目 |
中文题目 |
分类代码 |
TC/SC |
|
IEC/TRF 60335-2-16 |
２．０ |
9 November 2007 |
This Test Report Form applies to IEC 60335-2-16:2002 (5th edition) with IEC 60335-1:2001 (4th Ed.) incl. Corr. 1: 2002 + Corr. 2: 2005 + Am1: 2004 + Am2: 2006 |
本实验报告格式适用于IEC 60335-2-16:2002 (5版)、 IEC 60335-1:2001 (4版.)，包括勘误表1: 2002 + 勘误表2: 2005 + 修改1: 2004 + 修改2: 2006 |
|
|
|
IEC/TRF 60065 |
４．０ |
9 November 2007 |
This Test Report Form applies to IEC 60065:2001 (ed.7) + Amd 1:2005 |
本实验报告格式适用于IEC 60065:2001 (7版) + 修改1:2005 |
|
|
|
ISO/IEC 29106 |
１．０ |
7 November 2007 |
Information technology - Generic cabling - Introduction to the MICE environmental classification |
信息技术---通用电缆---MICE 环境分类介绍 |
35.200. |
JTC 1/SC 25 |
|
IEC 62530 |
１．０ |
7 November 2007 |
Standard for SystemVerilog - Unified Hardware Design, Specification, and Verification Language |
系统级硬件描述语言（SystemVerilog）标准---统一设计、规范和鉴定语言 |
25.040. |
TC 93 |
|
IEC 62529 |
１．０ |
7 November 2007 |
Standard for Signal and Test Definition |
信号和试验规定标准 |
25.040. |
TC 93 |
|
IEC 62525 |
１．０ |
7 November 2007 |
Standard Test Interface Language (STIL) for Digital Test Vector Data |
数字测试矢量数据标准测试 接口语言(STIL) |
25.040. ; 19.080.
|
TC 93 |
|
IEC 62526 |
１．０ |
7 November 2007 |
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments |
半导体设计环境用标准试验接口语言(STIL)的扩展标准 |
25.040. |
TC 93 |
|
IEC 62527 |
１．０ |
7 November 2007 |
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification |
DCL水平规范用标准试验接口语言(STIL)的扩展标准 |
25.040. |
