|
标准号 |
版本 |
发布
时间 |
英文题目 |
中文题目 |
分类代码 |
TC/SC |
|
ISO/IEC CASCO-CONF |
1.0 |
18 October 2007 |
Conformity assessment - Certification and inspection bodies |
符合性评定---认证和检验机构 |
03.120.20; 01.040.03
|
SC CASCO |
|
IEC 60747-16-2-am1 |
1.0 |
18 October 2007 |
Amendment 1 - Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers |
修改1---半导体器件---第16-2部分：微波集成电路---频率准换算器 |
|
SC 47E |
|
IEC 62366 |
1.0 |
18 October 2007 |
Medical devices - Application of usability engineering to medical devices |
医用器件 ---可用性工程在医用器械中的应用 |
11.040. |
SC 62A |
|
IEC 60976 |
2.0 |
16 October 2007 |
Medical electrical equipment - Medical electron accelerators - Functional performance characteristics |
医用电子设备 ---医用电子加速器---功能性特点 |
13.280. ; 11.040.50 |
SC 62C |
|
CISPR 16-1-4-am1 |
2.0 |
16 October 2007 |
Amendment 1 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Radiated disturbances |
修改1---无线电干扰和抗扰测量仪器和测量方法规范---第1-4部分：无线电干扰和抗扰测量仪器---辅助设备---辐射干扰 |
33.100.10; 33.100.20 |
SC CIS/A |
|
CISPR 16-1-1 |
2.2 |
16 October 2007 |
Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus |
无线电干扰和抗扰测量仪器和测量方法规范---第1-1部分：无线电干扰和抗扰测量仪---测量仪器 |
33.100.10 |
SC CIS/A |
|
IEC 60904-9 |
2.0 |
16 October 2007 |
Photovoltaic devices - Part 9: Solar simulator performance requirements |
光电器件---第9部分：太阳模拟器性能要求 |
27.160. |
TC 82 |
|
CISPR 16-SER |
1.0 |
16 October 2007 |
Specification for radio disturbance and immunity measuring apparatus and methods - ALL PARTS |
无线电干扰和抗扰测量仪器和方法规范---所有部分 |
33.100.10; 33.100.20
|
SC CIS/A |
|
ISO/IEC 10373-6-am5 |
1.0 |
11 October 2007 |
Amendment 5 - Identification cards - Test methods - Part 6: Proximity cards - Bit rates of fc/64, fc/32 and fc/16 |
修改5 ---识别卡---测试方法---第6部分--- fc/64, fc/32 和fc/16位传输速度 |
35.240.15 |
SC JTC 1/SC 17 |
|
ISO/IEC 7816-2 |
2.0 |
11 October 2007 |
Identification cards - Integrated circuit cards - Part 2: Cards with contacts - Dimensions and location of the contacts |
识别卡---测试方法---第2部分--- 接触尺寸和部位 |
35.240.15 |
SC JTC 1/SC 17 |
